Download Materials Characterization: Introduction to Microscopic and Spectroscopic Methods PDF EPUB
Author: Yang Leng
Pages: 384
Size: 2.536,30 Kb
Publication Date: June 2,2008
Category: Materials Science
This book covers state-of-the-art techniques commonly found in modern materials characterization. Finally, vibrational spectroscopy (FTIR and Raman) and thermal evaluation are also covered. Trusted techniques, such as for example metallography (light microscopy), X-ray diffraction, tranny and scanning electron microscopy, are described. The next half of the publication accordingly presents methods such as for example X-ray energy dispersive spectroscopy (commonly outfitted in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface evaluation methods (XPS and SIMS). Furthermore, the reserve introduces advanced methods, which includes scanning probe microscopy. Two important areas of characterization, components structures and chemical evaluation, are included.